Microscopy

Scanning Electron Microscopy (SEM)/Energy Dispersive Spectroscopy (EDS)

Characterization 1

MTL houses a JEOL 840A SEM with LaB6 gun that is capable of producing high resolution images for low conducting semiconducting samples and another JEOL 840 that utilizes w-filament gun but it is retrofitted with an IXRF EDS system with dot mapping, line scan, particle size analysis, and many other features.

Trace Elemental Analysis

Laser Induced Breakdown Spectroscopy (LIBS)

Characterization 2

TRACER ™ 2100 is a benchtop laser spectroscopy instrument that utilizes plasma technology to perform rapid screening as well as detailed analysis of trace elements in liquids, solids and slurries. Precision of this instrument is a few percent and detection limit in the low ppm range for many elements and matrices.

Chemical Compound Analysis

Fourier Transform Infrared Spectrophotometer (FTIR)

Chracterization 3

This instrument has Transmittance as well as reflectance modes and it is utilized to analyze iron oxides and hydroxides.

Thickness Measurement System

X-ray Fluorescence Spectroscopy

Characterization 3

This system makes use of X-ray Fluorescence techniques to measure thickness of thin films deposited.

Thermal Analysis

Thermal Gravimetric Analysis (TGA)/Differential Scanning Calorimetric (DSC)

Characterization 5

Thermo TGA1000 and TMA500 are available at MTL for thermal analysis and phase transformation studies of solid samples.